ELECTRONIC DEVICES RESEARCH
As semiconductor device feature sizes shrink and new nanoscale materials are developed, traditional characterization tools used to study local changes within semiconductors and electronic circuits start becoming obsolete. With Protochips’ workflow-based in situ TEM solutions, you can utilize the electron microscope to study structure-function relationships that govern the underlying mechanisms dictating device performance as they scale.
FUSION AX
Perform electrical characterization and high-temperature studies in the vacuum of the TEM
Follow resistive switching processes, charge and discharge nanobatteries while measuring coulombic efficiency, and study your materials’ electrical properties at high temperatures, all without compromising on resolution.
In the video: The antiskyrmion motion can be followed as current pulses drive it.
Guang, Y. et al. (2024) Nature Communications, 15, 7701
THE PROTOCHIPS PHILOSOPHY
Each Protochips in situ TEM solution has been designed with three key goals in mind to ensure relevance of the results in a timely fashion.
Scaling Bulk to Nano
Accelerating Productivity
Fostering Collaboration and Discovery
FEATURED PAPERS
Explore our latest peer-reviewed articles from top in situ researchers around the world. Want to read out entire list of publications on electronic devices? Find it by clicking here!
DOWNLOADS
What have our users done in the field? Read our summaries here!
Electronic Devices One Pager
Download the one pager that shows how Poseidon AX can be used to study electronic devices with in situ electron microscopy.
Using Protochips AXON Software for Tracking Electron Flux and Cumulative Dose
In this paper, we take a look at how AXON Dose tracks the electron flux and cumulative dose, and why this might be useful for all experiments.
Simultaneous Electrical and Heating Using Fusion: Electric-Field Assisted Sintering of ZrO2 Nanoparticles
In this summarized paper, researchers in the van Benthem group at University of California, Davis, studied sintering mechanisms in 3mol% yttria-stablized ZrO2 (3YSZ) nanoparticles using Fusion system with electrical biasing capabilities.
Off-Axis Electron Holography Under High Temperature and Oxidizing Environment
In this paper, in situ heating and off-axis holography were combined to better understand the magnetic redistribution in magnetite particles. This work was conducted by multiple groups including Almeida at Imperial College London, Dunin-Borkowski at the Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons (ER-C) and the Peter Grünberg Institute and Hansen at Denmark Technical University (DTU) Center for Electron Microscopy.
In Situ Atomic Structure Manipulation of Graphene
In this summarized paper, Chen in the Zettl group at UC Berkeley and Lawrence Berkeley National Lab transferred single layer graphene to E-chips and made electrical contacts via electron beam lithography. Moreover, Qi in the Johnson group at Pennsylvania used the Fusion system to apply electrical current at slow voltage ramping rates.
Visualizing the Electrical Switching Mechanism in ZnO-Based ReRAM Devices
In this summarized paper researchers from National Chiao Tung University in Hsinchu, Taiwan used the Fusion system to perform electrical biasing on a thin sample from a ReRAM device, which consisted of a ZnO layer sandwiched between two Pt electrodes.
Atomic Scale Imaging of 2-D Materials
This paper shows how Alex Zettl’s lab at UC Berkeley and at the National Center for Electron Microscopy at Lawrence Berkeley National Laboratory (NCEM, LBNL) have characterized the atomic scale structure of CVD grown h-BN in situ in the TEM using a Fusion system.
VIDEOS
Watch dynamic behavior of real samples in situ or scroll through to view short presentations of users all over the world on electronic devices.
Current User?
Find our preparation guides, applications notes and other support material on our Success Community.
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