As semiconductor device feature sizes shrink and new nanoscale materials are developed, traditional characterization tools used to study local changes within semiconductors and electronic circuits start becoming obsolete. With in situ TEM, you can image systems at atomic resolution to conduct understand working conditions or test the performance of new devices and materials in your lab.
Follow resistive switching processes, charge and discharge nanobatteries while measuring columbic efficiency, and study your materials’ electrical properties at high temperature, all without compromising on resolution.Click here to learn more about our in situ heating and biasing
Mapping the chemical stability of thermoelectric materials in the SEM
Phase transformations in magnetic iron-based nanoparticles
Exploring electrical switching mechanisms of nanoscale ReRAM devices
Using precise electrical biases to reduce defect density in graphene sheets
Improving coulombic efficiency of lithium-ion batteries with in situ quantitative electrochemistry
Watch dynamic behavior of real samples in situ.
Read more about the observation of charging and discharging of lithium batteries via in situ TEM by Mehdi et al. here: https://pubs.acs.org/doi/10.1021/acs.nanolett.5b00175
Using the Protochips Fusion System in the SEM, we show Schott glass melting at ~620 °C. Its known melting point is 622 °C. This demonstrates the accuracy of the Fusion heating system. For more information on Fusion, visit www.protochips.com/fusion.
This video shows gold nanoparticles at 600 C. The video shows the stability of the Protochips Fusion™ at high temperatures and the ability to resolve dynamic events with sub-Angstrom resolution. The initial video was taken at 1 frame per second, and then sped up to 5 frames per second using video editing software later. The video was taken in the TEAM 0.5 microscope (FEI Titan, 300 kV, Cs aberration correction, monochromator) at Berkeley National Laboratory, Berkeley, California.