As semiconductor device feature sizes shrink and new nanoscale materials are developed, traditional characterization tools used to study local changes within semiconductors and electronic circuits start becoming obsolete. With in situ TEM, you can image systems at atomic resolution to conduct understand working conditions or test the performance of new devices and materials in your lab.


Fusion AX: Study high temperature heating, electrical and electrothermal in vacuum

Follow resistive switching processes, charge and discharge nanobatteries while measuring columbic efficiency, and study your materials’ electrical properties at high temperature, all without compromising on resolution.

Click here to learn more about our in situ heating and biasing

What have our users done in the field? Read our summaries here!


Watch dynamic behavior of real samples in situ.