Preparation of High-Quality Sample for MEMS-Based In-Situ (S)TEM Experiments
Posted March 7, 2023
Tuesday publication update! Congratulations to @Vesna from the university of Stuttgart on publishing this nice work showing a new methodology for the preparation of focussed ion beam (FIB) lamella for in-situ microscopy. Additionally, they investigated what the influence of the beam was on the electrical and electro-thermal measurements. Furthermore, thinning of the whole lamella or parts of the lamella, as well as forming/cutting different slits into the lamella might influence the electrical characteristics as determined in this new publication, and needs to be carefully considered for each specific case.
#FusionSelect #FIB #Protochips #Findyourbreakthrough #preparationmethods #electronmicroscopy