Electronic Devices Library

Research conducted using the any products that have a background in electronic devices.

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Journal Articles

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TitleURLCitation
Athermal defect recovery in high entropy alloys: Real-time evidence from in-situ TEMhttps://linkinghub.elsevier.com/retrieve/pii/S1359646225004877Rahman, Md Hafijur; Al-Mamun, Nahid Sultan; Oh, Hajin; Haque, Aman , Athermal defect recovery in high entropy alloys: Real-time evidence from in-situ TEM, 2026, Scripta Materialia, 10.1016/j.scriptamat.2025.117025
High temperature operation and failure of Ga2O3 Schottky barrier diodes: An in situ TEM studyhttps://pubs.aip.org/aed/article/1/1/016103/3339205/High-temperature-operation-and-failure-of-Ga2O3Al-Mamun, Nahid Sultan; Li, Jian-Sian; Haque, Aman; Wolfe, Douglas E.; Ren, Fan; Pearton, Stephen , High temperature operation and failure of Ga2O3 Schottky barrier diodes: An in situ TEM study, 2025, APL Electronic Devices, 10.1063/5.0250729
In Situ Atomic-Scale Investigation of Electromigration Behavior in Cu Cu Joints at High Current Densityhttps://pubs.acs.org/doi/10.1021/acsnano.5c07534Huang, Hua-Jing; Wang, Chien-Hua; Wang, Che-Hung; Shen, Fang-Chun; Yang, Shih-Chi; Ong, Jia-Juen; Chiu, Wei-Lan; Chang, Hsiang-Hung; Chen, Chih; Wu, Wen-Wei , In Situ Atomic-Scale Investigation of Electromigration Behavior in Cu Cu Joints at High Current Density, 2025, ACS Nano, 10.1021/acsnano.5c07534
One-Step Electrospun WO 3 /CuO p n Heterojunction Nanocomposites for Ultrasensitive and Rapid H 2 S Detectionhttps://pubs.acs.org/doi/10.1021/acssensors.5c01761Qiu, Changkun; Zhu, Liang; Li, Qingrun; Wang, Haozhi; An, Fei; Wang, Shiqiang; Fan, Chao; Zhang, Dongzhi; Yang, Zhe , One-Step Electrospun WO 3 /CuO p n Heterojunction Nanocomposites for Ultrasensitive and Rapid H 2 S Detection, 2025, ACS Sensors, 10.1021/acssensors.5c01761
In Situ Study of Resistive Switching in a Nitride?Based Memristive Devicehttps://advanced.onlinelibrary.wiley.com/doi/10.1002/adfm.202517173Zhang, Di; Dhall, Rohan; Schneider, Matthew M.; Li, Cun; Song, Chengyu; Kunwar, Sundar; Dou, Hongyi; Yazzie, Natanii R.; Tran, Henry; Appuing, Daniel; Ciston, Jim; Cucciniello, Nicholas G.; Roy, Pinku; Pettes, Michael T.; Watt, John; Kuo, Winson; Wang, Haiyan; Cao, Ye; McCabe, Rodney J.; Chen, Aiping , In Situ Study of Resistive Switching in a Nitride?Based Memristive Device, 2025, Advanced Functional Materials, 10.1002/adfm.202517173
Current?Controllable and Reversible Multi?Resistance?State Based on Domain Wall Number Transition in 2D Ferromagnet Fe 3 GeTe 2 https://onlinelibrary.wiley.com/doi/10.1002/adma.202311831Yang, Chendi; Huang, Yalei; Pei, Ke; Long, Xiumin; Yang, Liting; Luo, Yongming; Lai, Yuxiang; Zhang, Jincang; Cao, Guixin; Che, Renchao , Current?Controllable and Reversible Multi?Resistance?State Based on Domain Wall Number Transition in 2D Ferromagnet Fe 3 GeTe 2 , 2024, Advanced Materials, 10.1002/adma.202311831
Uncovering Atomic Migrations Behind Magnetic Tunnel Junction Breakdownhttps://pubs.acs.org/doi/abs/10.1021/acsnano.4c08023Yun, Hwanhui; Lyu, Deyuan; Lv, Yang; Zink, Brandon R; Khanal, Pravin; Zhou, Bowei; Wang, Wei-Gang; Wang, Jian-Ping; Mkhoyan, K Andre , Uncovering Atomic Migrations Behind Magnetic Tunnel Junction Breakdown, 2024, ACS Nano, 10.1021/acsnano.4c08023
Imaging localized variable capacitance during switching processes in silicon diodes by time-resolved electron holographyhttps://link.aps.org/doi/10.1103/PhysRevB.109.085310Wagner, Tolga; elik, H seyin; Lehmann, Michael; Berger, Dirk; H usler, Ines , Imaging localized variable capacitance during switching processes in silicon diodes by time-resolved electron holography, 2024, Physical Review B, 10.1103/PhysRevB.109.085310
Synergistic effects of heating and biasing of AlGaN/GaN high electron mobility transistors: An in-situ transmission electron microscopy studyhttps://linkinghub.elsevier.com/retrieve/pii/S0026271424001501Al-Mamun, Nahid Sultan; Islam, Ahmad; Glavin, Nicholas; Haque, Aman; Wolfe, Douglas E.; Ren, Fan; Pearton, Stephen , Synergistic effects of heating and biasing of AlGaN/GaN high electron mobility transistors: An in-situ transmission electron microscopy study, 2024, Microelectronics Reliability, 10.1016/j.microrel.2024.115470
Endotaxial stabilization of 2D charge density waves with long-range orderhttps://www.nature.com/articles/s41467-024-45711-3Sung, Suk Hyun; Agarwal, Nishkarsh; El Baggari, Ismail; Kezer, Patrick; Goh, Yin Min; Schnitzer, Noah; Shen, Jeremy M.; Chiang, Tony; Liu, Yu; Lu, Wenjian; Sun, Yuping; Kourkoutis, Lena F.; Heron, John T.; Sun, Kai; Hovden, Robert , Endotaxial stabilization of 2D charge density waves with long-range order, 2024, Nature Communications, 10.1038/s41467-024-45711-3
Enhanced resistive switching performance and structural evolution of NiO/Nb2O5?x bilayer memristive devicehttps://linkinghub.elsevier.com/retrieve/pii/S0925838824004766Wang, Chien-Hua; Lo, Hung-Yang; Huang, Chun-Wei; Chen, Jui-Yuan; Wu, Wen-Wei , Enhanced resistive switching performance and structural evolution of NiO/Nb2O5?x bilayer memristive device, 2024, Journal of Alloys and Compounds, https://doi.org/10.1016/j.jallcom.2024.173889
Highly disordered amorphous Li-battery electrolyteshttps://linkinghub.elsevier.com/retrieve/pii/S2590238523006173Zhu, Yuntong; Hood, Zachary D.; Paik, Haemin; Groszewicz, Pedro B.; Emge, Steffen P.; Sayed, Farheen N.; Sun, Chengjun; Balaish, Moran; Ehre, David; Miara, Lincoln J.; Frenkel, Anatoly I.; Lubomirsky, Igor; Grey, Clare P.; Rupp, Jennifer L.M. , Highly disordered amorphous Li-battery electrolytes, 2024, Matter, 10.1016/j.matt.2023.12.004
Constrained patterning of orientated metal chalcogenide nanowires and their growth mechanismhttps://www.nature.com/articles/s41467-024-50525-4Yang, Qishuo; Wang, Yun-Peng; Shi, Xiao-Lei; Li, XingXing; Zhao, Erding; Chen, Zhi-Gang; Zou, Jin; Leng, Kai; Cai, Yongqing; Zhu, Liang; Pantelides, Sokrates T.; Lin, Junhao , Constrained patterning of orientated metal chalcogenide nanowires and their growth mechanism, 2024, Nature Communications, 10.1038/s41467-024-50525-4
Demystifying the Semiconductor?to?Metal Transition in Amorphous Vanadium Pentoxide: The Role of Substrate/Thin Film Interfaceshttps://onlinelibrary.wiley.com/doi/10.1002/adfm.202309544Esther, A. Carmel Mary; Muralikrishna, G. Mohan; Chirumamilla, Manohar; Pinto, Manoel Da Silva; Ostendorp, Stefan; Peterlechner, Martin; Yu Petrov, Alexander; Eich, Manfred; Divinski, Sergiy V.; Hahn, Horst; Wilde, Gerhard , Demystifying the Semiconductor?to?Metal Transition in Amorphous Vanadium Pentoxide: The Role of Substrate/Thin Film Interfaces, 2024, Advanced Functional Materials, 10.1002/adfm.202309544
Electrochemical rewiring through quantum conductance effects in single metallic memristive nanowireshttp://xlink.rsc.org/?DOI=D3NH00476GMilano, Gianluca; Raffone, Federico; Bejtka, Katarzyna; De Carlo, Ivan; Fretto, Matteo; Pirri, Fabrizio Candido; Cicero, Giancarlo; Ricciardi, Carlo; Valov, Ilia , Electrochemical rewiring through quantum conductance effects in single metallic memristive nanowires, 2024, Nanoscale Horizons, 10.1039/D3NH00476G
Unveiling Interface Engineering Dynamics between Ti and Ga2o3 Nanowirehttps://www.sciencedirect.com/science/article/abs/pii/S0169433224013254Hsieh, Ping-Wen; Chi, Chong-Chi; Wu, Che-Ming; Hsiao, Kai-Yuan; Lu, Ming-Yen , Unveiling Interface Engineering Dynamics between Ti and Ga2o3 Nanowire, 2024, Applied Surface Science, 10.2139/ssrn.4789003
Atomic?Scale Tracking Topological Phase Transition Dynamics of Polar Vortex?Antivortex Pairshttps://onlinelibrary.wiley.com/doi/10.1002/adma.202312072Zhu, Ruixue; Zheng, Sizheng; Li, Xiaomei; Wang, Tao; Tan, Congbing; Yu, Tiancheng; Liu, Zhetong; Wang, Xinqiang; Li, Jiangyu; Wang, Jie; Gao, Peng , Atomic?Scale Tracking Topological Phase Transition Dynamics of Polar Vortex?Antivortex Pairs, 2024, Advanced Materials, 10.1002/adma.202312072
In Situ TEM Investigation of Thermally Induced Modifications of Cluster-Assembled Gold Films Undergoing Resistive Switching: Implications for Nanostructured Neuromorphic Deviceshttps://pubs.acs.org/doi/10.1021/acsanm.3c06261Casu, Alberto; Chiodoni, Angelica; Ivanov, Yurii P.; Divitini, Giorgio; Milani, Paolo; Falqui, Andrea , In Situ TEM Investigation of Thermally Induced Modifications of Cluster-Assembled Gold Films Undergoing Resistive Switching: Implications for Nanostructured Neuromorphic Devices, 2024, ACS Applied Nano Materials, 10.1021/acsanm.3c06261
Atomic?Scale Phase Transformation in Perovskite LaCoO x Resistive Switching Memristive Deviceshttps://onlinelibrary.wiley.com/doi/10.1002/sstr.202400019Chen, Yen?Jung; Lo, Hung?Yang; Chiu, Chun?Chien; Wang, Che?Hung; Yang, Jan?Chi; Chen, Jui?Yuan; Wu, Wen?Wei , Atomic?Scale Phase Transformation in Perovskite LaCoO x Resistive Switching Memristive Devices, 2024, Small Structures, 10.1002/sstr.202400019
Artifact-free sample preparation of metal thin films using Xe plasma-focused ion beam milling for atomic resolution and in situ biasing analyseshttps://linkinghub.elsevier.com/retrieve/pii/S1044580324006417Lee, Hee-Beom; Kim, Seon Je; Jung, Min-Hyoung; Kim, Young-Hoon; Kim, Su Jae; Gao, Hai-Feng; Van Leer, Brandon; Jeong, Se-Young; Jeong, Hu Young; Kim, Young-Min , Artifact-free sample preparation of metal thin films using Xe plasma-focused ion beam milling for atomic resolution and in situ biasing analyses, 2024, Materials Characterization, 10.1016/j.matchar.2024.114260
In-situ S/TEM DC biasing of p-GaN/AlGaN/GaN heterostructure for E-mode GaN HEMT deviceshttps://iopscience.iop.org/article/10.1088/2631-8695/ad2f84Mehta, Abhas B; Zhu, Xiangyu; Shichijo, S; Kim, M J , In-situ S/TEM DC biasing of p-GaN/AlGaN/GaN heterostructure for E-mode GaN HEMT devices, 2024, Engineering Research Express, 10.1088/2631-8695/ad2f84
Elucidating Dynamic Conductive State Changes in Amorphous Lithium Lanthanum Titanate for Resistive Switching Deviceshttps://www.sciencedirect.com/science/article/pii/S2949822823001028Shimizu, Ryosuke; Cheng, Diyi; Zhu, Guomin; Han, Bing; Marchese, Thomas S; Xu, Mingjie; Pan, Xiaoqing; Zhang, Minghao; Meng, Ying Shirley , Elucidating Dynamic Conductive State Changes in Amorphous Lithium Lanthanum Titanate for Resistive Switching Devices, 2024, Next Materials, 10.1016/j.nxmate.2023.100102
A simple and intuitive model for long-range 3D potential distributions of in-operando TEM-samples: Comparison with electron holographic tomographyhttps://linkinghub.elsevier.com/retrieve/pii/S0304399124001360 elik, H seyin; Fuchs, Robert; Gaebel, Simon; G nther, Christian M.; Lehmann, Michael; Wagner, Tolga , A simple and intuitive model for long-range 3D potential distributions of in-operando TEM-samples: Comparison with electron holographic tomography, 2024, Ultramicroscopy, 10.1016/j.ultramic.2024.114057
Growth and Faceting of Tungsten and Oxides in Scandate Cathode Particles during In Situ Heating in the Scanning Electron Microscopehttps://www.mdpi.com/2073-4352/14/10/840Bai, Huanhuan; Balk, Thomas John , Growth and Faceting of Tungsten and Oxides in Scandate Cathode Particles during In Situ Heating in the Scanning Electron Microscope, 2024, Crystals, 10.3390/cryst14100840
Approaches to nanosolder reflow at the nanoscalehttps://journals.sagepub.com/doi/10.1177/13621718241297476Zhang, Xuan; Zhang, Wei , Approaches to nanosolder reflow at the nanoscale, 2024, Sage Journals, 10.1177/13621718241297476
Heat current-driven topological spin texture transformations and helical q-vector switchinghttps://www.nature.com/articles/s41467-023-42846-7Yasin, Fehmi Sami; Masell, Jan; Karube, Kosuke; Shindo, Daisuke; Taguchi, Yasujiro; Tokura, Yoshinori; Yu, Xiuzhen , Heat current-driven topological spin texture transformations and helical q-vector switching, 2023, Nature Communications, 10.1038/s41467-023-42846-7
All?Solid?State Garnet?Based Lithium Batteries at Work In Operando TEM Investigations of Delithiation/Lithiation Process and Capacity Degradation Mechanismhttps://onlinelibrary.wiley.com/doi/10.1002/advs.202205012Hou, An?Yuan; Huang, Chih?Yang; Tsai, Chih?Long; Huang, Chun?Wei; Schierholz, Roland; Lo, Hung?Yang; Tempel, Hermann; Kungl, Hans; Eichel, R diger?A.; Chang, Jeng?Kuei; Wu, Wen?Wei , All?Solid?State Garnet?Based Lithium Batteries at Work In Operando TEM Investigations of Delithiation/Lithiation Process and Capacity Degradation Mechanism, 2023, Advanced Science, 10.1002/advs.202205012
In Situ TEM/STEM Investigation of Crystallization in Y 3 Al 5 O 12 :Ce at High Temperatures Inside a Transmission Electron Microscopehttps://onlinelibrary.wiley.com/doi/10.1002/smll.202308001Liu, Zheng; Nakamura, Hitomi; Akai, Tomoko , In Situ TEM/STEM Investigation of Crystallization in Y 3 Al 5 O 12 :Ce at High Temperatures Inside a Transmission Electron Microscope, 2023, Small, 10.1002/smll.202308001
Emergent layer stacking arrangements in c-axis confined MoTe2https://www.nature.com/articles/s41467-023-40528-yHart, James L.; Bhatt, Lopa; Zhu, Yanbing; Han, Myung-Geun; Bianco, Elisabeth; Li, Shunran; Hynek, David J.; Schneeloch, John A.; Tao, Yu; Louca, Despina; Guo, Peijun; Zhu, Yimei; Jornada, Felipe; Reed, Evan J.; Kourkoutis, Lena F.; Cha, Judy J. , Emergent layer stacking arrangements in c-axis confined MoTe2, 2023, Nature Communications, 10.1038/s41467-023-40528-y
Investigation of Atomic?Scale Mechanical Behavior by Bias?Induced Degradation in Janus and Alloy Polymorphic Monolayer TMDs via In Situ TEMhttps://onlinelibrary.wiley.com/doi/10.1002/smsc.202300129Sung, Hsin-Ya; Chen, Chieh-Ting; Tseng, Yi-Tang; Chueh, Yu-Lun; Wu, Wen-Wei , Investigation of Atomic?Scale Mechanical Behavior by Bias?Induced Degradation in Janus and Alloy Polymorphic Monolayer TMDs via In Situ TEM, 2023, Small Science, 10.1002/smsc.202300129
Mapping of the Electrostatic Potentials in a Fully Processed Led Device with nm?Scale Resolution by In Situ off?Axis Electron Holographyhttps://onlinelibrary.wiley.com/doi/10.1002/smtd.202300537Cooper, David; Licitra, Christophe; Boussadi, Younes; Ben?Bakir, Badhise; Masenelli, Bruno , Mapping of the Electrostatic Potentials in a Fully Processed Led Device with nm?Scale Resolution by In Situ off?Axis Electron Holography, 2023, Small Methods, 10.1002/smtd.202300537
Liquid-Cell Transmission Electron Microscopy Observation of Two-Step Collapse Dynamics of Silicon Nanopillars on Evaporation of Propan-2-ol: Implications for Semiconductor Integration Densityhttps://pubs.acs.org/doi/10.1021/acsanm.2c01744Sasaki, Yuta; Yamazaki, Tomoya; Kimura, Yuki , Liquid-Cell Transmission Electron Microscopy Observation of Two-Step Collapse Dynamics of Silicon Nanopillars on Evaporation of Propan-2-ol: Implications for Semiconductor Integration Density, 2022, ACS Applied Nano Materials, 10.1021/acsanm.2c01744
The influence of illumination conditions in the measurement of built-in electric field at p n junctions by 4D-STEMhttps://aip.scitation.org/doi/10.1063/5.0104861da Silva, Bruno C sar; Momtaz, Zahra, S.; Bruas, Lucas; Rouviere, Jean-Luc; Okuno, Hanako; Cooper, D.; Den Hertog, Martien Ilse , The influence of illumination conditions in the measurement of built-in electric field at p n junctions by 4D-STEM, 2022, Applied Physics Letters, https://doi.org/10.1063/5.0104861
Tailoring electron beams with high-frequency self-assembled magnetic charged particle micro opticshttps://www.nature.com/articles/s41467-022-30703-yHuber, R.; Kern, F.; Karnaushenko, D. D.; Eisner, E.; Lepucki, P.; Thampi, A.; Mirhajivarzaneh, A.; Becker, C.; Kang, T.; Baunack, S.; B chner, B.; Karnaushenko, D.; Schmidt, O. G.; Lubk, A. , Tailoring electron beams with high-frequency self-assembled magnetic charged particle micro optics, 2022, Nature Communications, 10.1038/s41467-022-30703-y
Observing resistive switching behaviors in single Ta2O5 nanotube-based memristive deviceshttps://linkinghub.elsevier.com/retrieve/pii/S2588842022000402Liu, C.-J.; Lo, H.-Y.; Hou, A.-Y.; Chen, J.-Y.; Wang, C.-H.; Huang, C.-W.; Wu, W.-W. , Observing resistive switching behaviors in single Ta2O5 nanotube-based memristive devices, 2022, Materials Today Nano, 10.1016/j.mtnano.2022.100212
Anisotropic Angstrom-Wide Conductive Channels in Black Phosphorus by Top-down Cu Intercalationhttps://pubs.acs.org/doi/10.1021/acs.nanolett.1c00915Lee, Suk Woo; Qiu, Lu; Yoon, Jong Chan; Kim, Yohan; Li, Da; Oh, Inseon; Lee, Gil-Ho; Yoo, Jung-Woo; Shin, Hyung-Joon; Ding, Feng; Lee, Zonghoon , Anisotropic Angstrom-Wide Conductive Channels in Black Phosphorus by Top-down Cu Intercalation, 2021, Nano Letters, 10.1021/acs.nanolett.1c00915
Unconventional Grain Growth Suppression in Oxygen-Rich Metal Oxide Nanoribbonshttps://www.science.org/doi/10.1126/sciadv.abh2012Jin Han, Hyeuk; Lee, Gyu Rac; Xie, Yujun; Hynek, David, J.; Cho, Eugene, N.; Kim,, Yeon Sik; Cha, Judy, J. , Unconventional Grain Growth Suppression in Oxygen-Rich Metal Oxide Nanoribbons, 2021, Science Advances, https://www.doi.org/10.1126/sciadv.abh2012
Structural Analysis and Performance in a Dual?Mechanism Conductive Filament Memristorhttps://onlinelibrary.wiley.com/doi/10.1002/aelm.202100605Tsai, Shu?Chin; Lo, Hong?Yang; Huang, Chih?Yang; Wu, Min?Ci; Tseng, Yi?Tang; Shen, Fang?Chun; Ho, An?Yuan; Chen, Jui?Yuan; Wu, Wen?Wei , Structural Analysis and Performance in a Dual?Mechanism Conductive Filament Memristor, 2021, Advanced Electronic Materials, 10.1002/aelm.202100605
Atomic-Scale Investigation of Electromigration with Different Directions of Electron Flow into High-Density Nanotwinned Copper through In Situ HRTEMhttps://linkinghub.elsevier.com/retrieve/pii/S1359645421006303Shen, Fang-Chun; Huang, Chih-Yang; Lo, Hung-Yang; Hsu, Wei-You; Wang, Chien-Hua; Chen, Chih; Wu, Wen-Wei , Atomic-Scale Investigation of Electromigration with Different Directions of Electron Flow into High-Density Nanotwinned Copper through In Situ HRTEM, 2021, Acta Materialia, 10.1016/j.actamat.2021.117250
Monitoring Electrical Biasing of Pb(Zr0.2Ti0.8)O3 Ferroelectric Thin Films In Situ by DPC-STEM Imaginghttps://www.mdpi.com/1996-1944/14/16/4749Vogel, Alexander; Sarott, Martin F.; Campanini, Marco; Trassin, Morgan; Rossell, Marta D. , Monitoring Electrical Biasing of Pb(Zr0.2Ti0.8)O3 Ferroelectric Thin Films In Situ by DPC-STEM Imaging, 2021, Materials, 10.3390/ma14164749
Imaging Secondary Electron Emission from a Single Atomic Layerhttps://onlinelibrary.wiley.com/doi/abs/10.1002/smtd.202000950Dyck, Ondrej; Swett, Jacob L.; Lupini, Andrew R.; Mol, Jan A.; Jesse, Stephen , Imaging Secondary Electron Emission from a Single Atomic Layer, 2021, Small Methods, https://doi.org/10.1002/smtd.202000950
Atomic scale symmetry and polar nanoclusters in the paraelectric phase of ferroelectric materialshttp://www.nature.com/articles/s41467-021-23600-3Bencan, Andreja; Oveisi, Emad; Hashemizadeh, Sina; Veerapandiyan, Vignaswaran K.; Hoshina, Takuya; Rojac, Tadej; Deluca, Marco; Drazic, Goran; Damjanovic, Dragan , Atomic scale symmetry and polar nanoclusters in the paraelectric phase of ferroelectric materials, 2021, Nature Communications, 10.1038/s41467-021-23600-3
Influence of Sr deficiency on structural and electrical properties of SrTiO 3 thin films grown by metal organic vapor phase epitaxyhttps://www.nature.com/articles/s41598-021-87007-2Baki, Aykut; St ver, Julian; Schulz, Tobias; Markurt, Toni; Amari, Houari; Richter, Carsten; Martin, Jens; Irmscher, Klaus; Albrecht, Martin; Schwarzkopf, Jutta , Influence of Sr deficiency on structural and electrical properties of SrTiO 3 thin films grown by metal organic vapor phase epitaxy, 2021, Scientific Reports, 10.1038/s41598-021-87007-2
The electric double layer effect and its strong suppression at Li+ solid electrolyte/hydrogenated diamond interfaceshttps://www.nature.com/articles/s42004-021-00554-7Tsuchiya, Takashi; Takayanagi, Makoto; Mitsuishi, Kazutaka; Imura, Masataka; Ueda, Shigenori; Koide, Yasuo; Higuchi, Tohru; Terabe, Kazuya , The electric double layer effect and its strong suppression at Li+ solid electrolyte/hydrogenated diamond interfaces, 2021, Communications Chemistry, 10.1038/s42004-021-00554-7
Imaging real-time amorphization of hybrid perovskite solar cells under electrical biasinghttps://doi.org/10.1021/acsenergylett.1c01707Kim, Min-cheol; Ahn, Namyoung; Cheng, Diyi; Xu, Mingjie; Pan, Xiaoqing; Jun, Suk; Luo, Yanqi; Fenning, David P; Tan, Darren H S; Zhang, Minghao; Ham, So-Yeon; Jeong, Kiwan; Choi, Mansoo; Meng, Ying Shirley , Imaging real-time amorphization of hybrid perovskite solar cells under electrical biasing, 2021, ACS Energy Letters, https://doi.org/10.1021/acsenergylett.1c01707
Electron beam induced current microscopy of silicon p n junctions in a scanning transmission electron microscopehttps://aip.scitation.org/doi/10.1063/5.0040243Conlan, Aidan P.; Moldovan, Grigore; Bruas, Lucas; Monroy, Eva; Cooper, David , Electron beam induced current microscopy of silicon p n junctions in a scanning transmission electron microscope, 2021, Journal of Applied Physics, 10.1063/5.0040243
Assembly of Pt Nanoparticles on Graphitized Carbon Nanofibers as Hierarchically Structured Electrodeshttps://pubs.acs.org/doi/10.1021/acsanm.0c01945Hodnik, Nejc; Romano, Luigi; Jovanovi?, Primo ; Ruiz-Zepeda, Francisco; Bele, Marjan; Fabbri, Filippo; Persano, Luana; Camposeo, Andrea; Pisignano, Dario , Assembly of Pt Nanoparticles on Graphitized Carbon Nanofibers as Hierarchically Structured Electrodes, 2020, ACS Applied Nano Materials, 10.1021/acsanm.0c01945
Operando Control of Skyrmion Density in a Lorentz Transmission Electron Microscope with Current Pulseshttp://arxiv.org/abs/2006.16780Park, Albert M.; Chen, Zhen; Zhang, Xiyue S.; Zhu, Lijun; Muller, David A.; Fuchs, Gregory D. , Operando Control of Skyrmion Density in a Lorentz Transmission Electron Microscope with Current Pulses, 2020, ArXiv, 10.1063/5.0020373
Understanding the role of interface in advanced semiconductor nanostructure and its interplay with wave function overlaphttps://doi.org/10.1007/s12274-020-2764-2Cai, Chenyuan; Zhao, Yunhao; Chang, Faran; Zhao, Xuebing; Yang, Liting; Liang, Chongyun; Wang, Guowei; Niu, Zhichuan; Shi, Yi; Liu, Xianhu; Li, Yuesheng; Che, Renchao , Understanding the role of interface in advanced semiconductor nanostructure and its interplay with wave function overlap, 2020, Nano Research, 10.1007/s12274-020-2764-2
Configurable Resistive Response in BaTiO 3 Ferroelectric Memristors via Electron Beam Radiationhttps://onlinelibrary.wiley.com/doi/abs/10.1002/adma.201907541Molinari, Alan; Witte, Ralf; Neelisetty, Krishna Kanth; Gorji, Saleh; K bel, Christian; M nch, Ingo; W hler, Franziska; Hahn, Lothar; Hengsbach, Stefan; Bade, Klaus; Hahn, Horst; Kruk, Robert , Configurable Resistive Response in BaTiO 3 Ferroelectric Memristors via Electron Beam Radiation, 2020, Advanced Materials, 10.1002/adma.201907541
Electrical conduction and field emission of a single-crystalline GdB 44 Si 2 nanowirehttp://xlink.rsc.org/?DOI=D0NR04707DTang, Shuai; Tang, Jie; Chiu, Ta-Wei; Yuan, Jinshi; Tang, Dai-Ming; Mitome, Masanori; Uesugi, Fumihiko; Nemoto, Yoshihiro; Takeguchi, Masaki; Qin, Lu-Chang , Electrical conduction and field emission of a single-crystalline GdB 44 Si 2 nanowire, 2020, Nanoscale, 10.1039/D0NR04707D
Improved measurement of electric fields by nanobeam precession electron diffractionhttps://aip.scitation.org/doi/abs/10.1063/5.0006969Bruas, L.; Boureau, V.; Conlan, A. P.; Martinie, S.; Rouviere, J.-L.; Cooper, D. , Improved measurement of electric fields by nanobeam precession electron diffraction, 2020, Journal of Applied Physics, 10.1063/5.0006969
In-situ TEM Electrical Characterization of void formation and growth along Cu interconnect Via: FIB based sample preparation methodhttps://doi.org/10.31399/asm.cp.istfa2020p0290Barda, Hagit; Geppert, Irina; Raz, Avraham; Berthier, R my , In-situ TEM Electrical Characterization of void formation and growth along Cu interconnect Via: FIB based sample preparation method, 2020, ISTFA Proceedings, https://doi.org/10.31399/asm.cp.istfa2020p0290
Observing topotactic phase transformation and resistive switching behaviors in low power SrCoOx memristorhttps://linkinghub.elsevier.com/retrieve/pii/S2211285520302408Lo, Hung-Yang; Yang, Chih-Yu; Huang, Guan-Ming; Huang, Chih-Yang; Chen, Jui-Yuan; Huang, Chun-Wei; Chu, Ying-Hao; Wu, Wen-Wei , Observing topotactic phase transformation and resistive switching behaviors in low power SrCoOx memristor, 2020, Nano Energy, 10.1016/j.nanoen.2020.104683
Heterointerface?Driven Band Alignment Engineering and its Impact on Macro?Performance in Semiconductor Multilayer Nanostructureshttps://onlinelibrary.wiley.com/doi/10.1002/smll.201900837Cai, Chenyuan; Zhao, Yunhao; Xie, Shengwen; Zhao, Xuebing; Zhang, Yu; Xu, Yingqiang; Liang, Chongyun; Niu, Zhichuan; Shi, Yi; Li, Yuesheng; Che, Renchao , Heterointerface?Driven Band Alignment Engineering and its Impact on Macro?Performance in Semiconductor Multilayer Nanostructures, 2019, Small, 10.1002/smll.201900837
In Situ Nanostructural Analysis of Volatile Threshold Switching and Non?Volatile Bipolar Resistive Switching in Mixed?Phased a ?VO x Asymmetric Crossbarshttps://onlinelibrary.wiley.com/doi/abs/10.1002/aelm.201900605Nirantar, Shruti; Mayes, Edwin; Rahman, Md. Ataur; Ahmed, Taimur; Taha, Mohammad; Bhaskaran, Madhu; Walia, Sumeet; Sriram, Sharath , In Situ Nanostructural Analysis of Volatile Threshold Switching and Non?Volatile Bipolar Resistive Switching in Mixed?Phased a ?VO x Asymmetric Crossbars, 2019, Advanced Electronic Materials, 10.1002/aelm.201900605
Observation of Resistive Switching Behavior in Crossbar Core Shell Ni/NiO Nanowires Memristorhttps://onlinelibrary.wiley.com/doi/abs/10.1002/smll.201703153Ting, Yi-Hsin; Chen, Jui-Yuan; Huang, Chun-Wei; Huang, Ting-Kai; Hsieh, Cheng-Yu; Wu, Wen-Wei , Observation of Resistive Switching Behavior in Crossbar Core Shell Ni/NiO Nanowires Memristor, 2018, Small, 10.1002/smll.201703153
Revealing conducting filament evolution in low power and high reliability Fe3O4/Ta2O5 bilayer RRAMhttps://linkinghub.elsevier.com/retrieve/pii/S2211285518306736Chang, Chia-Fu; Chen, Jui-Yuan; Huang, Guan-Min; Lin, Ting-Yi; Tai, Kuo-Lun; Huang, Chih-Yang; Yeh, Ping-Hung; Wu, Wen-Wei , Revealing conducting filament evolution in low power and high reliability Fe3O4/Ta2O5 bilayer RRAM, 2018, Nano Energy, 10.1016/j.nanoen.2018.09.029
Memristors with diffusive dynamics as synaptic emulators for neuromorphic computinghttps://www.nature.com/articles/nmat4756Wang, Zhongrui; Joshi, Saumil; Savel ev, Sergey E.; Jiang, Hao; Midya, Rivu; Lin, Peng; Hu, Miao; Ge, Ning; Strachan, John Paul; Li, Zhiyong; Wu, Qing; Barnell, Mark; Li, Geng-Lin; Xin, Huolin L.; Williams, R. Stanley; Xia, Qiangfei; Yang, J. Joshua , Memristors with diffusive dynamics as synaptic emulators for neuromorphic computing, 2017, Nature Materials, 10.1038/nmat4756
In situ chemoresistive sensing in the environmental TEM: probing functional devices and their nanoscale morphologyhttps://pubs.rsc.org/en/content/articlelanding/2017/nr/c6nr09322aSteinhauer, Stephan; Vernieres, Jerome; Krainer, Johanna; K ck, Anton; Grammatikopoulos, Panagiotis; Sowwan, Mukhles , In situ chemoresistive sensing in the environmental TEM: probing functional devices and their nanoscale morphology, 2017, Nanoscale, 10.1039/C6NR09322A
Probing electron beam effects with chemoresistive nanosensors during in situ environmental transmission electron microscopyhttps://aip.scitation.org/doi/abs/10.1063/1.4977711Steinhauer, S.; Wang, Z.; Zhou, Z.; Krainer, J.; K ck, A.; Nordlund, K.; Djurabekova, F.; Grammatikopoulos, P.; Sowwan, M. , Probing electron beam effects with chemoresistive nanosensors during in situ environmental transmission electron microscopy, 2017, Applied Physics Letters, 10.1063/1.4977711
Structural evolution during calcination and sintering of a (La 0.6 Sr 0.4 ) 0.99 CoO 3? ? nanofiber prepared by electrospinninghttps://iopscience.iop.org/article/10.1088/1361-6528/aa73a6Simonsen, S B; Shao, J; Zhang, W , Structural evolution during calcination and sintering of a (La 0.6 Sr 0.4 ) 0.99 CoO 3? ? nanofiber prepared by electrospinning, 2017, Nanotechnology, 10.1088/1361-6528/aa73a6
Direct Observation of Dual-Filament Switching Behaviors in Ta2O5-Based Memristorshttps://onlinelibrary.wiley.com/doi/abs/10.1002/smll.201603116Chang, Chia-Fu; Chen, Jui-Yuan; Huang, Chun-Wei; Chiu, Chung-Hua; Lin, Ting-Yi; Yeh, Ping-Hung; Wu, Wen-Wei , Direct Observation of Dual-Filament Switching Behaviors in Ta2O5-Based Memristors, 2017, Small, 10.1002/smll.201603116
In-situ TEM observation of Multilevel Storage Behavior in low power FeRAM devicehttp://www.sciencedirect.com/science/article/pii/S2211285517300794Chiu, Chung-Hua; Huang, Chun-Wei; Hsieh, Ying-Hui; Chen, Jui-Yuan; Chang, Chia-Fu; Chu, Ying-Hao; Wu, Wen-Wei , In-situ TEM observation of Multilevel Storage Behavior in low power FeRAM device, 2017, Nano Energy, 10.1016/j.nanoen.2017.02.008
External-field-induced crystal structure and domain texture in (1?x)Na0.5Bi0.5TiO3 xK0.5Bi0.5TiO3 piezoceramicshttp://www.sciencedirect.com/science/article/pii/S1359645417300642Otonicar, M.; Park, J.; Logar, M.; Esteves, G.; Jones, J. L.; Jancar, B. , External-field-induced crystal structure and domain texture in (1?x)Na0.5Bi0.5TiO3 xK0.5Bi0.5TiO3 piezoceramics, 2017, Acta Materialia, 10.1016/j.actamat.2017.01.052
Atomically engineered ferroic layers yield a room-temperature magnetoelectric multiferroichttp://www.nature.com/articles/nature19343Mundy, Julia A.; Brooks, Charles M.; Holtz, Megan E.; Moyer, Jarrett A.; Das, Hena; R bola, Alejandro F.; Heron, John T.; Clarkson, James D.; Disseler, Steven M.; Liu, Zhiqi; Farhan, Alan; Held, Rainer; Hovden, Robert; Padgett, Elliot; Mao, Qingyun; Paik, Hanjong; Misra, Rajiv; Kourkoutis, Lena F.; Arenholz, Elke; Scholl, Andreas; Borchers, Julie A.; Ratcliff, William D.; Ramesh, Ramamoorthy; Fennie, Craig J.; Schiffer, Peter; Muller, David A.; Schlom, Darrell G. , Atomically engineered ferroic layers yield a room-temperature magnetoelectric multiferroic, 2016, Nature, 10.1038/nature19343
Dynamic Evolution of Conducting Nanofilament in Resistive Switching Memorieshttps://doi.org/10.1021/nl4015638Chen, Jui-Yuan; Hsin, Cheng-Lun; Huang, Chun-Wei; Chiu, Chung-Hua; Huang, Yu-Ting; Lin, Su-Jien; Wu, Wen-Wei; Chen, Lih-Juann , Dynamic Evolution of Conducting Nanofilament in Resistive Switching Memories, 2013, Nano Letters, 10.1021/nl4015638
Platinum Nanoparticles Grown by Atomic Layer Deposition for Charge Storage Memory Applicationshttps://iopscience.iop.org/article/10.1149/1.3365031Novak, Steven; Lee, Bongmook; Yang, Xiangyu; Misra, Veena , Platinum Nanoparticles Grown by Atomic Layer Deposition for Charge Storage Memory Applications, 2010, Journal of The Electrochemical Society, 10.1149/1.3365031