In Situ Electron Beam Induced Current Analysis with TEM

Dr. Rémy Berthier (Protochips) and Dr. Greg Moldovan (point electronic GmbH) will share their knowledge and expertise on in situ TEM electrical characterization and EBIC analysis of devices, and how to combine the two for high-resolution microscopy. As electronic devices keep getting smaller, the increase in spatial and temporal resolution that the TEM provides is becoming critical to key innovation-driving sectors, including failure analysis, device manufacturing, and device research.”

WATCH HERE: https://youtu.be/DgC2BBv3UUM