Electronic Devices

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The AXON Platform – A Machine Vision Technology for Transmission Electron Microscopy

March 13, 2026

Flash Talk #37 with Dr. Xiangli Zhong

Dr. Xiangli Zhong from The University of Manchester presents a new method for preparing samples for in situ Transmission Electron Microscopy (TEM) using Focused Ion Beam (FIB) systems.

February 18, 2026

Real-Time TEM Observation of the Microstructural Evolution in Silver Nanowires under Heating and Electrical Biasing

Fusion AX Publication Alert in ACS Electr. Mater. on Electronic Devices!

February 10, 2026

Success Community Updates September 2025

October 9, 2025

Interview with Experts: Dr. Burak Ozdol from Western Digital on Semiconductor Research using In Situ Microscopy

September 1, 2025

An In Situ TEM Study of the Diffusivity of Gold Atoms in Nanocomposite Thin Films by Zirconia Co-Deposition: Implication for Neuromorphic Devices

Publication Alert in ACS using the Fusion AX system for Materials Science

August 19, 2025

Topological magnetic defects in a strong permanent magnet Nd2Fe14B

Publication Alert in Materials Today Quantum with Fusion AX for Electronic Devices

July 15, 2025

Flash Talk #32 with Dr. Francisco Lagunas Vargas

June 26, 2025

Lowering the sintering temperature of LiCoO2 using LiOH

Publication Alert with Fusion AX in Solid State Ionics for Battery Materials

June 17, 2025

Flash Talk #31 with Dr. Oana Condurache

June 5, 2025

Why Do You Need to Care about FAIR Data Management or RDM?

May 1, 2025

Direct observation of the interface reaction dynamics of the NdCeFeB phase via in situ annealing & quenching STEM

Fusion AX Publication Alert in RSC Advances for Electronic Devices

April 15, 2025