Dr. Xiangli Zhong from The University of Manchester presents a new method for preparing samples for in situ Transmission Electron Microscopy (TEM) using Focused Ion Beam (FIB) systems.
Watch it here: https://youtu.be/4UApS1XN-xM
Read the paper here: https://academic.oup.com/mam/article/31/3/ozaf029/8128038
