Preparation of High-Quality Sample for MEMS-Based In-Situ (S)TEM Experiments
Tuesday publication update! Congratulations to @Vesna from the university of Stuttgart on publishing this nice work showing a new methodology for the preparation of focussed ion beam (FIB) lamella for in-situ microscopy. Additionally, they investigated what the influence of the beam was on the electrical and electro-thermal measurements. Furthermore, thinning of the whole lamella or … Read More