Dynamic Imaging of Projected Electric Potentials of Operando Semiconductor Devices by Time-Resolved Electron Holography

Fusion AX Publication Alert in Electronics for Electronic Devices

Tuesday publication post! 📖 This publication from Humbolt University and the Technical University of Berlin focusses on ultrafast time-resolved electron holography using Interference Gating (iGate), a technique that combines simplicity with unmatched precision for investigating high-speed electronic processes. They use the #FusionAX system to observe biasing phenomena through holography on an ultrafast switching silicon diode.

⚡With this technique the authors achieved nanometer spatial and nanosecond temporal resolution (25 ns) with a 3 MHz repetition rate, enabling dynamic observations of local electric potentials.
🔬It was possible to visualize time-dependent potential distributions in the space-charge region of a silicon diode during switching between unbiased and reverse-biased states.
📈Complementary static and dynamic experiments confirm strong alignment between modeled and measured projected potentials.

The authors show that iGate transforms operando investigations of semiconductor devices, opening new possibilities for nanoscale imaging of high-speed electronic processes. With this level of precision, researchers can better understand and optimize next-gen semiconductor technology.

Congratulations on the great work Tolga Wagner, Hüseyin Çelik, Simon Gaebel, Dirk Berger, Peng-Han Lu, Ines Häusler, Nina Owschimikow, Michael Lehmann, Rafal E. Dunin-Borkowski, Christoph T. Koch and Fariba Hatami!

Want to read the entire work? Find it here!
https://www.mdpi.com/2079-9292/14/1/199

2025 01 03 Fusion
2025 01 03 Fusion

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