Tuesday publication post! 📖 In this publication, the #FusionAX system combined with #AXONSynchronicity enables correlated, time-resolved TEM analysis to unravel the atomic-scale origins of multilevel resistive switching in HfOx-based RRAM. By synchronizing structural and electronic insights, the authors reveal how crystallography and defect dynamics jointly define device performance.
Key highlights:
🔬 The Fusion AX was combined with AXON Synchronicity to drift correct any heat
🔥Reveals a “crystal phase–vacancy–electric field” tri-level mechanism governing resistive switching behavior
🔄 Thermally driven crystal rotation enables oxygen vacancy migration, driving transitions between resistance states
This work establishes a unified framework connecting atomic structure, defect physics, and device operation, highlighting how precise control of thermal and electrical conditions can enable reliable multilevel switching for next-generation computing-in-memory technologies.
Want to read the entire work? Find it here!
https://www.doi.org/10.1002/advs.202518252
Want to know more about our Fusion AX system?
https://www.protochips.com/solutions/in-situ-tem-solutions/in-situ-heating-and-electrical/
