21st Annual Conference on Microscopy of Semiconducting Materials

Fitzwilliam College
Storey's Way
Cambridge, CB3 0DG United Kingdom

04/09/2019 - 04/12/2019

The 21st International Conference on Microscopy of Semiconducting Materials (MSM-XXI) reports progress in the imaging, diffraction and spectroscopy of inorganic and hybrid perovskite semiconductor nanostructures used in (opto)electronic and photonic devices, as well as interfaces of thin dielectric, metal or polymer films to such semiconductors.