FEMMS (Frontiers of Electron Microscopy and Materials Science) is a biennial meeting focused on the application of electron microscopy, primarily TEM, in materials science.
The conference series arose to satisfy the requirements of the electron microscopy community working on materials science problems, which grew explosively in the late 1980’s and has expanded to researchers working with analytical periphery, novel instrumentation, tomography, operando and correlative microscopy, and advancing into the domain of ultrafast time-resolved microscopy.
Traditionally, FEMMS brings together approximately 40 invited speakers plus one distinguished lecturer that are world-renowned experts, principal investigators and project leaders, to present their latest advances in the field of electron microscopy in the materials sciences.