Fusion AX enables in situ heating and electrical biasing inside the TEM, providing unparalleled control over dynamic processes at the nanoscale. Whether you are observing phase transformations, studying material stability, or exploring new pathways in energy storage and conversion, Fusion AX bridges the gap between traditional TEM and real-world operating conditions.
In this system, micro-electromechanical systems (MEMS), called E-chips™, are used to add stimuli to samples, without compromising vacuum integrity of the microscope. What kind of stimuli can these E-chips provide to the sample?
Key Features of Fusion AX:
- Precise Heating: Achieve uniform heating up to 1200 °C, enabling the study of thermal effects on material transformations, sintering, and crystallization.
- Electrical Biasing: Perform advanced electrical characterization with accurate voltage and current control to study device behavior, conductivity, and failure mechanisms.
- Unmatched Stability: The patented AXON Synchronicity software eliminates drift, delivering crystal-clear, stable images even during temperature and voltage changes.
- Friction-Free Tilting: Tilt your sample in two directions, without losing connection to the E-chips!
- Dynamic Observation: Visualize processes like grain growth, phase changes, and material degradation in real time with nanoscale precision.
Fusion AX combines the precision of TEM with the flexibility to apply external stimuli, enabling researchers to ask new questions and gain deeper insights.
Find some interesting review papers below:
- Barmak, K., Rickman, J.M. and Patrick, M.J. (2024) ‘Advances in Experimental Studies of Grain Growth in Thin Films’, JOM, 76, 3622–3636
- He, B. et al. (2020) ‘In-situ Transmission Electron Microscope Techniques for Heterogeneous Catalysis’, ChemCatChem, 12, 1853–1872
- Campanini, M., Erni, R. and Rossell, M.D. (2020) ‘Probing local order in multiferroics by transmission electron microscopy’, Physical Sciences Reviews, 5
