As transistor size shrinks, traditional characterization tools used to study local changes within semiconductors and electronic circuits start becoming obsolete. With in situ TEM, you can image systems at atomic resolution to conduct quality control under working conditions or test the performance of new devices and materials in your lab.
Mapping the chemical stability of thermoelectric materials in the SEM
Phase transformations in magnetic iron-based nanoparticles
Exploring electrical switching mechanisms of nanoscale ReRAM devices
Using precise electrical biases to reduce defect density in graphene sheets
Improving coulombic efficiency of lithium-ion batteries with in situ quantitative electrochemistry
Watch dynamic behavior of real samples in situ.
Fusion is an advanced system used to heat and electrically bias samples within an electron microscope.The system is optimized to produce heating up to 1200 °C or electrical biasing without degrading the resolution of the instrument. With Fusion, atomic resolution of heated samples is now possible. This video outlines the Fusion technology as we well as several scientific applications. Additional information can be found at: http://www.protochips.com/products/fusion.html
Using the Protochips Fusion System in the SEM, we show Schott glass melting at ~620 °C. Its known melting point is 622 °C. This demonstrates the accuracy of the Fusion heating system. For more information on Fusion, visit www.protochips.com/fusion.
This video shows gold nanoparticles at 600 C. The video shows the stability of the Protochips Fusion™ at high temperatures and the ability to resolve dynamic events with sub-Angstrom resolution. The initial video was taken at 1 frame per second, and then sped up to 5 frames per second using video editing software later. The video was taken in the TEAM 0.5 microscope (FEI Titan, 300 kV, Cs aberration correction, monochromator) at Berkeley National Laboratory, Berkeley, California.
This workflow explains the procedure for preparing FIB samples onto a MEMS-based E-chip for in situ TEM. FIB sample preparation can be used to prepare a wide variety of materials for TEM or in situ TEM analysis and is a relatively simple technique to learn. For more information, tips and tricks, and sample preparation guides, visit our library of content at www.protochips.com
Charge and discharge nanoscale batteries and their liquid electrolytes while monitoring battery performance and coulombic efficiency.Learn more
Apply current and voltage to nanoscale samples ranging from transistors to 2D materials.Learn more