Characterizing material systems often requires numerous tools that must be used independently to understand the underlying science. With in situ electron microscopy, you can often use your microscope to simultaneously study the structure, processing, properties, and performance of material systems in real-time.
Dynamic reactions between iron nanoparticles and graphene catalysts in methane
Description and measurement of thermal drift during heating experiments
EDS analysis in the SEM and TEM during heating experiments
Mapping the chemical stability of thermoelectric materials in the SEM
Visualizing defect mobility of 2D materials at elevated temperatures
Exploring electrical switching mechanisms of nanoscale ReRAM devices
Uncovering coalescence mechanisms during electric-field assisted sintering
Watch dynamic behavior of real samples in situ.
This is an introduction to the basic performance of the Atmosphere system for conducting in situ environmental TEM studies,
An Fe nanoparticle etching few-layer graphene (FLG) at 900 degrees C and 600 Torr of H2. The Fe nanoparticle preferentially etches the graphene along specific crystallographic directions.
Credit: SI-IPCMS-CNRS/University of Strasbourg, France: G. Melinte, S. Moldovan and O. Ersen
This real-time video shows two gold nanoparticles that are on the surface of larger iron oxide particles at 900° C. At this temperature the gold is very mobile, and the two particles coalesce into one larger nanoparticle. This demonstrates the stability of the Protochips Fusion system at high temperatures. This video was taken on a JEOL ARM200F (200 kV, Cs aberration correction) at JEOL in Akishima, Japan. For more information on Fusion, visit www.protochips.com/fusion
The Poseidon platform enables observation of dynamic processes in situ. This movie shows the formation of salt crystals from a saturated solution of phosphate buffered saline. Images were acquired at a rate of 1 frame per second and are shown at 5 times real speed. 500 nm liquid thickness. Images collected using a Philips/FEI CM300FEG TEM at 300 kV. Courtesy of Dr. Kate Klein, National Institute of Standards and Technology. For more information on Poseidon, visit http://bit.ly/protochipsposeidon.
This workflow explains the procedure for preparing FIB samples onto a MEMS-based E-chip for in situ TEM. FIB sample preparation can be used to prepare a wide variety of materials for TEM or in situ TEM analysis and is a relatively simple technique to learn. For more information, tips and tricks, and sample preparation guides, visit our library of content at www.protochips.com
Study material performance in liquid environments.Learn more
Investigate the effects of electricity and temperature on material properties and sample morphology.Learn more
See the effect of corrosive gasses on ceramics, metals, and many other materials in real-time.Learn more