Introducing the world's first MEMS-based heating stage for
Transmission Electron Microscopy
Real-time, or in situ microscopy is a critical need in many areas of materials science, including catalysis, coatings, and novel materials. Until now, no commercially viable solutions have existed that enable real-time studies in a fast, versatile, high-resolution and easy-to-use package. Join us at Microscopy and Microanalysis 2008 in Albuquerque, NM to be part of the arrival of this revolutionary technology.

See RESULTS from Aduro™ at
Microscopy and Microanalysis 2008
Not only can you come by the Protochips booth (#610) to see this amazing technology, but also, you can attend workshops, see posters and listen to scientific talks. Below is a list of where you can find information about Aduro at Microscopy and Microanalysis 2008. If you would like to plan to meet at the conference, then call us at (919) 341-2612 or send us an email and we would be happy to schedule a time to meet in person to talk about your specific interests and see how Aduro could be of benefit to you.
Exhibitor Hall
Protochips booth #610
Workshops
"PRISM: Practical Remote In-situ Microscopy"
presenter: Larry Allard
Location & time: 5:30pm Monday evening at the JEOL booth (#1027)
"Introduction to Aduro(TM): A MEMS-based Heating Platform for in-situ TEM"
presenter: John Damiano
Location & time: 5:30pm Tuesday evening at the Protochips booth (#610)
Scientific Talks
"A New Paradigm for Ultra-High-Resolution Imaging at Elevated Temperatures";
L. F. Allard, W. C. Bigelow, D. P. Nackashi, J. Damiano and S. E. Mick
"Study of Pd/ZnO Nanocatalysts for Hydrogen Production"; J. Liu, J. Wang and L. F. Allard
"In-situ Z-STEM Imaging of Chemical Ordering in FePt Magnetic Nanoparticles";
J.E. Wittig, J. Bentley, L.F. Allard, M.S. Wellons and C.M. Lukehar
Poster Sessions
"In-situ TEM Observations on the Sintering Process of Colloidal Gold Using an Ultra-fast Heating Stage"; M. Briceno, K. Hattar, John Damiano, David Nackashi, I.M. Robertson
"A MEMS-based Technology Platform for in-situ TEM Heating Studies ";
John Damiano, David P. Nackashi, and Stephen E. Mick
Aduro™ Technology
Although specimen supports have historically been used to simply hold samples, The Protochips Aduro™ technology platform has revolutionized analytical capabilities by enabling the observation and manipulation of specimens with great precision and at high resolutions.
Protochips has developed an innovative and patent pending technology platform based upon semiconductor devices and materials, which integrates capabilities including temperature control directly onto the specimen support. Protochips' semiconductor approach not only enables real-time analysis using an electron microscope, but allows it to be easy to use, versatile, fast, and at the highest resolution possible. The technology is based upon a family of ultra-thin, robust semiconductor-based "windows" that can be used to create and rapidly change a very specific environment around an object while allowing the electron microscope to image the sample.
Pt nanoparticle catalyst on Al2O3 support at 1000°C, 20 second scans imaged approximately 1 minute apart at 10,000,000X. Images collected using a JEOL 2200FS-AC Aberration Corrected TEM. Courtesy of Dr. Larry Allard, Oak Ridge National Laboratories
Applications
| • Rapid thermal cycling and lifetime testing |
• Quality Assurance |
| • Ultra-high and high temperature studies |
• Grain Growth |
| • Thin films and Coatings |
• Quenching |
| • Nanoparticle catalysts |
• Sintering |
Features and Benefits
Features |
Benefits |
Extremely low thermal mass |
High stability and low drift, less than 1ms response time |
Direct heating of support film |
Very accurate temperature control of sample |
Robust ceramic material |
Inert, capable of reaching temperatures from ambient to 1200°C |
MEMS-based design |
Consumable design eliminates contamination, compatible with virtually any TEM and STEM instrument. |
Product Specifications
| Temperature Range |
Ambient to 1200°C +/- 0.5-3°C |
| Tilt |
Alpha |
| Device Size |
Approximately 3mm X 3mm |
| Observable Area |
500microns X 500microns |
| Power Requirements |
100/220 VAC |
Additional Information
Heating stages and holders require customization to fit your particular instrument. Please contact us to discuss your needs and to learn more about this revolutionary new technology for your SEM, TEM or STEM. Please fill out the form below or send us an e-mail to get the conversation started!: